Active nanocharacterization of nanofunctional materials by scanning tunneling microscopy

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Active nanocharacterization of nanofunctional materials by scanning tunneling microscopy.

Recent developments in the application of scanning tunneling microscopy (STM) to nanofabrication and nanocharacterization are reviewed. The main focus of this paper is to outline techniques for depositing and manipulating nanometer-scale structures using STM tips. Firstly, the transfer of STM tip material through the application of voltage pulses is introduced. The highly reproducible fabricati...

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ژورنال

عنوان ژورنال: Science and Technology of Advanced Materials

سال: 2008

ISSN: 1468-6996,1878-5514

DOI: 10.1088/1468-6996/9/1/013003